
Paul
definitely interested!
Are you/@baragonaru perhaps interested in the muxed e-test efforts?
I want(ed) that to allow us to measure hundreds of dies with (analog mux, basically like on TinyTapeout, but with each DUT area much smaller relative to the amount of analog wires fed to it, and no digital MUX to each DUT) somewhat around a hundred DUTs, using a 100%-coverage-testing setup similar to the bond tester, i.e. utilizing the cheap COB packaging.
(Though unlike the bond tester with a much nicer stack of benchtop multimeters than just a few bias resistors, 3 discrete analog MUX chips, and a Raspberry Pi Pico2.)
The idea was to set up for having 4-wire/kelvin style access to all DUT "LEF pins" (including VDD; substrate-tied VSS is special because the substrate itself isn't isolated, so it'd only need a sense wire MUXed to not include ground bounce in the measurements) through just a pair of analog switches with routing kept separated right up to each DUT "LEF pin", enough such to handle at least most of the SCL (4 in, 1 out, VSS, GND? 13 MUX wires).
Though an idea of making them a bit larger to accomodate two smaller DUTs or one big DUT, or having two MUX bus spines with the DUT area in the middle and allowing with the control logic to have slots that spread from one mux spine to the other getting both's wires, is also being considered.
Xyce with likely Dakota would be used to dream up on the order of 10k to 1M sample points to measure a DUT at, using an approximation algorithm for (getting quite usefully close to) optimal experiment design with the goal being to end up with a set of bias conditions under which to test the DUT on each of the dies that approximate maximum information gain as far as all the extraction uncertainties/imprecision-compensation-factors (shapes don't print like they're drawn due to resolution limitations; we should at least cough up correction tweak factors to allow the simulation with them applied to be a VERY close match to physical reality), and SPICE model card parameters are concerned.
I should probably take some care to specifically not attempt to accurately measure the "random variables" that codify local mismatch, as we're trying to create a precise model that helps us on future dies that contain these DUTs instead of our product being a model that's precisely fit to an individual test die and could thus accurately predict the measurements at random new test points/biasing conditions applied to the very die. Though the parametric statistical distributions that express this local mismatch are very much part of what we'd be trying to extract statistically significant measurements of. Because those can be used to then compute Liberty timing uncertainties (I'm not sure to what extend Liberty let alone our open tooling supports modeling statistical variations of propagation latency, nor how large those even are and whether we'd realistically even account for them or just slightly widen the timing margins), which should have some notable effect in sufficiently deep clock trees under PVT conditions that emphasize local mismatch more than global PVT (vs. usual), due to resulting clock skew between branches.
The measurements would be collected at near-DC conditions (I don't really know how to realistically do it for relevantly higher ones without loosing most of the benefits of such a dense-analog-MUX-bus architecture; also such multimeters are far simpler/commodity than ones that can handle AC with anywhere near as much accuracy) and Xyce with Dakota (and/or ROL) would be used to model-fit our extraction tweakables, questionable spice model card parameters, and the "random variables" of global & local "monte carlo" mismatch modeling.
While there are some effects that only "really" affect capacitance without really affecting resistance, I'd think those could be measured with more targeted-to-that test structures; gate&junction capacitance should mostly come even from the near-DC model fitting anyways.